The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Jul. 01, 2021
Battelle Memorial Institute, Columbus, OH (US);
Joseph Matthew Cochran, Egg Harbor Township, NJ (US);
Matthew Robert Aderholdt, Vineland, NJ (US);
Jesse Thomas Buxton, Columbus, OH (US);
Laura Lee Strang Aume, Circleville, OH (US);
John Tatarowicz, Blackwood, NJ (US);
Rodney Hallgren, Philadelphia, PA (US);
Lucinda Flaherty, Bradenton, FL (US);
Andrew Aceti, Mays Landing, NJ (US);
BATTELLE MEMORIAL INSTITUTE, Columbus, OH (US);
Abstract
Various tray inserts, methods and algorithm for certifying candidate trays for use in an X-ray scanner system are discussed. The tray insert includes at least a body having multiple parts positioned for generation of image quality metrics for tray impact evaluation in; a first cover and a second cover disposed at opposite ends to fix and secure the body. The method including running an algorithm to control an X-ray system to collect baseline image data from certified trays, collecting candidate tray image data, extracting image quality metrics for both the baseline image data and the candidate tray image data, and performing statistical analysis using and comparing image quality metrics from the baseline image data and the candidate tray image data to certify the candidate tray based on the statistical and comparison results.