The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Apr. 04, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Lukasz G. Cmielowski, Cracow, PL;

Rafal Bigaj, Cracow, PL;

Wojciech Sobala, Cracow, PL;

Pawel Slowikowski, Cracow, PL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 8/35 (2018.01); G06N 3/08 (2006.01); G06F 16/901 (2019.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 8/35 (2013.01); G06F 16/9024 (2019.01); G06N 3/0454 (2013.01);
Abstract

Embodiments of the present invention enable a comparison of different machine-learning models based on a single neural network design may be provided. A deep learning architecture for an experimentation framework is represented as a directed acyclic graph with nodes representing neural network layers. Embodiments of the present invention specify a first machine-learning model in a first branch and a second machine-learning model in a second branch of the directed acyclic graph. Each branch has its own optimizer node. Embodiments of the present invention generate source code for the first machine-learning model and the second machine-learning model out of the directed acyclic graph, and train the first machine-learning model and the second machine-learning model simultaneously, thereby enabling the comparison of different machine-learning models.


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