The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Nov. 15, 2018
Applicant:

Snap Inc., Santa Monica, CA (US);

Inventors:

Jacob Minyoung Huh, La Crescenta, CA (US);

Shao-Hua Sun, Los Angeles, CA (US);

Ning Zhang, Los Angeles, CA (US);

Assignee:

Snap Inc., Santa Monica, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06V 30/19 (2022.01); G06N 3/08 (2006.01); G06V 30/194 (2022.01);
U.S. Cl.
CPC ...
G06N 3/0445 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06V 30/194 (2022.01);
Abstract

Disclosed is a feedback adversarial learning framework, a recurrent framework for generative adversarial networks that can be widely adapted to not only stabilize training but also generate higher quality images. In some aspects, a discriminator's spatial outputs are distilled to improve generation quality. The disclosed embodiments model the discriminator into the generator, and the generator learns from its mistakes over time. In some aspects, a discriminator architecture encourages the model to be locally and globally consistent.


Find Patent Forward Citations

Huh, Jacob. (2022). Feedback adversarial learning (U.S. Patent No. 11429841). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11429841

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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