The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Mar. 19, 2020
Applicant:

Data Culpa, Inc., Carlisle, MA (US);

Inventor:

J. Mitchell Haile, Somerville, MA (US);

Assignee:

Data Culpa Inc., Somerville, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2455 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24558 (2019.01); G06F 16/254 (2019.01);
Abstract

Systems and methods for data quality monitoring are provided. Various embodiments include a data monitoring system that integrates into a data pipeline. The data monitoring system may receive a call from the data pipeline to analyze data inputs entering the data pipeline. The monitoring system can generate metadata describing the data inputs and compare the generated metadata with previously generated metadata to determine if the data inputs are historically consistent. The data monitoring system may return a consistency measure to the data pipeline. In further embodiments, the data monitoring system can generate metadata describing data outputs from the data pipeline and compare the output metadata to previously generated output metadata. In further embodiments, the data monitoring system may operate as a read only entity in a database. The monitoring system may monitor for changes in the database and determine when adverse changes occur in the database.


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