The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Jul. 10, 2020
The Nielsen Company (Us), Llc, New York, NY (US);
Rachel Worth Olson, Elk Grove Village, IL (US);
Michael Evan Anderson, Chicago, IL (US);
Rishi Sriram, Naperville, IL (US);
Margaret M. Orton, Chicago, IL (US);
Fatemehossadat Miri, Chicago, IL (US);
Samantha M. Mowrer, San Francisco, CA (US);
David J. Kurzynski, South Elgin, IL (US);
Molly Poppie, Arlington Heights, IL (US);
THE NIELSEN COMPANY (US), LLC, New York, NY (US);
Abstract
Example methods, apparatus, systems and articles of manufacture (e.g., physical storage media) to deduplicate common devices across multiple data sources are disclosed. An example system includes a comparison controller to identify a first device in a first data source and a second device in a second data source as a possible common device. The example system also includes a first metric calculator to calculate a station duration metric based on first station duration data and second station duration data, the first station duration data associated with a first set of durations of time that the first device tuned to a first set of stations, the second station duration data associated with a second set of durations of time that the second device tuned to the first set of stations; a second metric calculator to calculate a time match metric based on first time data and second time data, the first time data associated with a first set of times of day that the first device tuned to a second set of stations, the second time data associated with a second set of times of day that the second device tuned to the second set of stations, the first set of times of day overlapping with the second set of times of day; and a third metric calculator to calculate a station path metric based on a first sequence of stations tuned to by the first device and a second sequence of stations tuned to by the second device. The example system also includes a comparison scorer to determine a joint score based on the station duration metric, the time match metric, and the station path metric; and a common device selector to determine when the first device and the second device are a common device based on the joint score.