The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Oct. 29, 2020
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Christoph J. Graham, Spring, TX (US);

Thomas J. Flynn, Spring, TX (US);

Virginia Quance Herrera, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0616 (2013.01); G06F 3/0653 (2013.01); G06F 3/0659 (2013.01); G06F 3/0673 (2013.01); G06F 11/076 (2013.01); G06F 11/0727 (2013.01); G06F 11/3034 (2013.01); G06F 11/3055 (2013.01); G06F 11/3072 (2013.01); G06F 11/3433 (2013.01); G06F 11/3452 (2013.01); G06F 11/3485 (2013.01); G06F 11/004 (2013.01); G06F 11/008 (2013.01); G06F 11/3058 (2013.01);
Abstract

Example implementations relate to determining a device wear-rate. An example system for determining a device wear-rate can include a plurality of filter drivers to: monitor system requests for I/O associated with a device of the system and transmit information associated with the system requests to a filter manager. The system can also include the filter manager to catalog the information, a service to collate the information across a plurality of machine configurations and workloads, and a processor to determine a wear-rate of the device based on an analysis of the collated information.


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