The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Mar. 18, 2021
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Masahiro Yoshioka, Allen, TX (US);

Jeffrey David Johnson, Tucson, AZ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/10 (2006.01); G05F 1/46 (2006.01); H03K 17/60 (2006.01); H03M 1/66 (2006.01);
U.S. Cl.
CPC ...
G05F 1/46 (2013.01); H03K 17/60 (2013.01); H03M 1/66 (2013.01);
Abstract

A bandgap voltage reference circuit includes first and second transistors (e.g., 3-terminal BJTs or diode-connected BJTs), and a PTAT element (e.g., resistance or capacitance). The first transistor is at a first die location, and operates with a first base-emitter voltage. The second transistor is at a second die location, and operates with a second base-emitter voltage. Each of the first and second transistors may include multiple individual parallel-connected transistors. The PTAT element is operatively coupled to the first and second transistors such that a voltage difference between the first and second base-emitter voltages drops across the PTAT element. The first and second locations are separated by a distance (e.g., 1.5% or more of die length, or such that the respective centroids of the first and second transistor are spaced from one another). Such spatial distribution helps mitigate voltage shift induced by mechanical stress, and is insensitive to process variation.


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