The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Dec. 18, 2018
Q-linea Ab, Uppsala, SE;
Jonas Jarvius, Uppsala, SE;
Jan Grawé, Uppsala, SE;
Q-LINEA AB, Uppsala, SE;
Abstract
A method for performing microscopy-based imaging of samples comprises: loading a sample holder () onto a support () configured to receive the sample holder (); moving the sample holder () in a first direction, from a starting position on a first strip of the sample holder (), to move the sample holder () relative to an imaging line of a line camera (), to capture an image of the first strip of the sample holder (); monitoring a focal plane using an autofocus system () as the sample holder () is moved in the first direction; in response to a signal from the autofocus system (), moving an objective lens () along the optical axis to adjust the focal plane; and moving the sample holder () in a second direction, to align the imaging line of the line camera () with a position on a second strip of the sample holder ().