The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Nov. 12, 2013
Applicant:
Image Insight Inc., East Hartford, CT (US);
Inventors:
Gordon A. Drukier, New Haven, CT (US);
Eric P. Rubenstein, Longmeadow, MA (US);
Yonatan B. Rubenstein, Longmeadow, MA (US);
Joshua C. Kessler, East Longmeadow, MA (US);
Peter R. Solomon, West Hartford, CT (US);
Marek A. Wojtowicz, East Hartford, CT (US);
Assignee:
IMAGE INSIGHT, INC., East Hartford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 7/00 (2006.01); G01T 1/02 (2006.01); G06T 7/20 (2017.01); G06T 7/80 (2017.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G01T 7/005 (2013.01); G01T 1/02 (2013.01); G06T 7/20 (2013.01); G06T 7/80 (2017.01); G06T 7/85 (2017.01); H04N 7/18 (2013.01);
Abstract
Systems and methods for calibrating multiple electronic devices are described herein. Such methods may include obtaining, by a processor, data from a plurality of reference electronic devices, analyzing, by a processor, the data and calibrating, by the processor, the electronic device based on the analyzed data obtained from the plurality of reference electronic devices.