The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Dec. 31, 2018
Koninklijke Philips N.v., Eindhoven, NL;
Peter George Van De Haar, Eindhoven, NL;
Walter Ruetten, Linnich, DE;
Heidrun Steinhauser, Eindhoven, NL;
Herman Stegehuis, Best, NL;
Onno Jan Wimmers, Valkenswaard, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An X-ray detector is positioned relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. The X-ray source and X-ray detector are controlled by a processing unit in order to operate in a first imaging operation mode, a second imaging operation mode, and/or a third imaging operation mode. The detector comprises a first scintillator, a second scintillator, a first sensor array, and a second sensor array. The first scintillator is disposed over the second scintillator such that X-rays emitted from the X-ray source first encounter the first scintillator and then encounter the second scintillator.