The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Aug. 24, 2018
Hitachi, Ltd., Tokyo, JP;
Suguru Yokosawa, Tokyo, JP;
Yo Taniguchi, Tokyo, JP;
Tomoki Amemiya, Tokyo, JP;
Toru Shirai, Tokyo, JP;
Hisaaki Ochi, Tokyo, JP;
FUJIFILM HEALTHCARE CORPORATION, Chiba, JP;
Abstract
An MRI device for executing an imaging operation at least three times or more with a different combination of at least a repetition time and a flip angle in the same imaging sequence, includes: a receiving unit which receives information specifying an imaging target and a constraint condition relating to an imaging time or quantitative value accuracy; and a scan parameter set generation unit which calculates at least three or more scan parameter sets having a different combination of at least the repetition time and the flip angle on the basis of the constraint condition. The MRI device uses three or more scan parameter sets generated by the optimal scan parameter set generation unit and calculates quantitative values (TTand the like) of the imaging target from a plurality of images obtained by the imaging operation.