The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Aug. 09, 2018
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Inventors:

Nobuyasu Haga, Seto, JP;

Hiroshi Hamaguchi, Toyota, JP;

Ryo Kanada, Toyota, JP;

Takanori Soejima, Toyota, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/392 (2019.01); H01M 10/617 (2014.01); H01M 10/42 (2006.01); G01R 31/3842 (2019.01); B60L 58/12 (2019.01); B60L 58/13 (2019.01); B60L 3/12 (2006.01); B60L 58/21 (2019.01); B60L 58/14 (2019.01); H01M 10/625 (2014.01); H01M 10/633 (2014.01); G01R 31/367 (2019.01); G01R 31/00 (2006.01); G01R 31/374 (2019.01); H02J 7/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/392 (2019.01); B60L 3/12 (2013.01); B60L 58/12 (2019.02); B60L 58/13 (2019.02); B60L 58/14 (2019.02); B60L 58/21 (2019.02); G01R 31/367 (2019.01); G01R 31/3842 (2019.01); H01M 10/42 (2013.01); H01M 10/425 (2013.01); H01M 10/617 (2015.04); H01M 10/625 (2015.04); H01M 10/633 (2015.04); H02J 7/0024 (2013.01); B60L 2240/545 (2013.01); B60L 2240/547 (2013.01); B60L 2240/549 (2013.01); G01R 31/007 (2013.01); G01R 31/374 (2019.01); H01M 2220/20 (2013.01);
Abstract

A method of estimating a deteriorated state of a battery includes steps Sto SSis a step of obtaining a voltage and a current of the battery a plurality of times for a data acquisition period. Sis a step of calculating an amount of change in current, an amount of change in temperature, and an amount of change in SOC during the data acquisition period. Sis a step of obtaining an allowable amount of change in current, an allowable amount of change in temperature, and an allowable amount of change in SOC based on an average temperature. Sis a step of calculating an impedance component for each frequency bandwidth based on the voltage and the current by subjecting the voltage and the current to Fourier transform when all amounts of change are smaller than the allowable amounts of change.


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