The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Jul. 17, 2020
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Gary A. Frazier, Garland, TX (US);

Randy L. Gann, Lewisville, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P 13/00 (2006.01); G01N 21/65 (2006.01); G01V 8/10 (2006.01); G08B 13/19 (2006.01);
U.S. Cl.
CPC ...
G01P 13/00 (2013.01); G01N 21/65 (2013.01); G01V 8/10 (2013.01); G08B 13/19 (2013.01);
Abstract

A method includes transmitting first optical energy towards a space being scanned. The method also includes detecting one or more instances of a first material in the space using first return optical energy, where the first return optical energy is based on the transmitted first optical energy. The method further includes, for each of the one or more instances of the first material, transmitting second optical energy towards a portion of the space in which the instance of the first material was detected. The method also includes detecting one or more instances of a second material in the space using second return optical energy, where the second return optical energy is based on the transmitted second optical energy. In addition, the method includes identifying a presence of at least one type of device in the space based on instances of the first and second materials detected in the space.


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