The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Oct. 16, 2020
Microtec S.r.l., Bressanone, IT;
Enrico Ursella, Mestre, IT;
Federico Giudiceandrea, Bressanone, IT;
MICROTEC S.R.L., Bressanone, IT;
Abstract
A method and a related apparatus for performing a tomographic examination of an object () which advances through an examination area (), wherein the examination area () is irradiated with x-rays transversally to a motion trajectory of the object () and the residual intensity of the x-rays which have crossed the object () is repeatedly detected to obtain, for each detection, an electronic two-dimensional pixel map, the two-dimensional maps thus obtained being processed by a computer to obtain a three-dimensional tomographic reconstruction of the object (); wherein, during the advancement, the object () is made or let rotate, at least partly uncontrolled, in such a way that the object () rotates around one or more rotation axes which are transversal both to the motion trajectory and to the propagation directions of the x-rays crossing it; and wherein a computer also determines the spatial position in which the object () is located relative to the one or more emitters () and/or the one or more detectors () at the instant when each two-dimensional map is detected, and factors this in the tomographic reconstruction.