The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Apr. 03, 2020
Nankai University, Tianjin, CN;
Meng-Xin Ren, Tianjin, CN;
Jun-Jun Ma, Tianjin, CN;
Jia-Xin Chen, Tianjin, CN;
Wei Wu, Tianjin, CN;
Wei Cai, Tianjin, CN;
Jing-Jun Xu, Tianjin, CN;
NANKAI UNIVERSITY, Tianjin, CN;
Abstract
A system for determining a second-order nonlinear susceptibility of a material includes a laser light source, a polarization modulator, a light collector, a polarization detector and a controller. The controller can obtain the second-order nonlinear susceptibility of the sample to be tested according to the test data. The system for determining the second-order nonlinear susceptibility of a material can directly test a material (block or film) with a thickness of hundreds of nanometers, and draw a second-order nonlinear susceptibility fitting curve of the material according to the test results of the optical system.