The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Dec. 19, 2017
Massachusetts Institute of Technology, Cambridge, MA (US);
Rohit Nandkumar Karnik, Cambridge, MA (US);
An Chang, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
Systems and methods for monitoring air particulate matter are provided herein that capture particles from the air for analysis. Particles are captured using electrostatic and/or mechanical means to deflect particles toward a substrate. Electrostatic precipitation causes charged carriers to deflect towards a charged substrate. Filtration-based means employ filters and/or fibers to capture particles from air flowing therethrough. A sensor such as a camera is used to read the captured particles. An illumination source directs light towards the substrate, causing the particles to scatter light, which the sensor can detect and derive information or imaging therefrom, which can also be used for further particle or pollution analyses. The substrate can be replenished using electrostatic techniques such as reverse electrostatic force, or mechanical means such as cleaning using a brush or replacing a tape substrate. Dynamic PM monitoring detects and makes adjustments such as those related to air volume, imaging characteristics and substrate replenishment.