The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Oct. 29, 2019
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Tetsuji Yamaguchi, Kyoto, JP;

Takeshi Akamatsu, Kyoto, JP;

Tatsuo Igushi, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/04 (2006.01); G01N 21/07 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0205 (2013.01); G01N 15/042 (2013.01); G01N 21/07 (2013.01); G01N 2015/045 (2013.01);
Abstract

The present claimed invention is to facilitate cleaning work of a cell for a particle size distribution measuring device that measures a particle size distribution by means of a line start method, and comprises a cellthat houses a density gradient solution, a cell rotating mechanismthat rotates the cellso that a centrifugal force is applied to the cellfrom a smaller density gradient to a larger density gradient and a sample introducing mechanismthat introduces a measurement sample into the cellthat is rotated by the cell rotating mechanism, and is so configured that the cellis detachable from a main body of the device.


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