The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Jun. 26, 2020
Applicant:

Bell Textron Inc., Fort Worth, TX (US);

Inventors:

Xiaoming Li, Colleyville, TX (US);

Bogdan R. Krasnowski, Bedford, TX (US);

Robert A. Figueroa, Colleyville, TX (US);

Robert Wardlaw, Keller, TX (US);

Assignee:

Textron Innovations Inc., Providence, RI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/62 (2006.01); G01N 3/02 (2006.01); G06F 30/15 (2020.01); G06F 119/18 (2020.01);
U.S. Cl.
CPC ...
G01N 3/62 (2013.01); G01N 3/02 (2013.01); G06F 30/15 (2020.01); G06F 2119/18 (2020.01);
Abstract

A notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer; isolating the notch; and selectively etching the notch to provide an etched surface of the notch; wherein at least a portion of the re-melt material layer has been removed from the notch. In one aspect, there is provided a notch treatment method for flaw simulation including providing the specimen with the notch, the notch having a re-melt material layer, the specimen includes steel or an alloy thereof; isolating the notch; and selectively etching the notch with a first etching solution and a second etching solution to provide an etched surface on the notch; wherein at least a portion of the re-melt material layer has been removed from the notch.


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