The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Mar. 11, 2019
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Assignee:
HITACHI, LTD., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/06 (2006.01); C12Q 1/66 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/06 (2013.01); C12Q 1/66 (2013.01);
Abstract
Provided is a method for detecting a microorganism in a test sample containing cells, including a step of adding the sample to a microorganism culture medium, a step of culturing the microorganism culture medium containing the sample, a step of sampling a part of the culture medium at a predetermined time, a step of acquiring the ATP level of the sampled culture medium, and a step of detecting the microorganism in the sample based on the change of the ATP level over time.