The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 30, 2022

Filed:

Mar. 20, 2019
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Kosuke Hattori, Kyoto, JP;

Yoshinori Konishi, Kyoto, JP;

Assignee:

OMRON CORPORATION, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); G06T 7/73 (2017.01); G06T 1/00 (2006.01); G01B 11/24 (2006.01); G06T 7/521 (2017.01); G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1697 (2013.01); G01B 11/005 (2013.01); G01B 11/24 (2013.01); G06T 1/0014 (2013.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01); B25J 9/1692 (2013.01); G01B 2210/52 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30164 (2013.01);
Abstract

An information processing apparatus includes: a determination unit configured to determine a plurality of measurement positions and/or orientations from which a 3D measurement sensor makes three-dimensional measurements; a controller configured to successively move the 3D measurement sensor to the plurality of measurement positions and/or orientations; a measurement unit configured to generate a plurality of 3D measurement data sets through three-dimensional measurement using the 3D measurement sensor at each of the plurality of measurement positions and/or orientations; and a data integration unit configured to integrate the plurality of 3D measurement data sets.


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