The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 30, 2022
Filed:
Jan. 23, 2020
Applicant:
6 Over 6 Vision Ltd., Kfar Saba, IL;
Inventors:
Ofer Limon, Kfar Saba, IL;
Alexander Zlotnik, Petah-Tikva, IL;
Yair Kittenplon, Raanana, IL;
Orna Bregman Amitai, Tel Aviv, IL;
Assignee:
6 OVER 6 VISION LTD., Kfar Saba, IL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/028 (2006.01); G06T 7/55 (2017.01); G06T 7/521 (2017.01); G06T 7/00 (2017.01); A61B 3/036 (2006.01); A61B 3/09 (2006.01); A61B 3/00 (2006.01); G01S 17/08 (2006.01);
U.S. Cl.
CPC ...
A61B 3/028 (2013.01); A61B 3/0025 (2013.01); A61B 3/036 (2013.01); A61B 3/09 (2013.01); G06T 7/0012 (2013.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01); G01S 17/08 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30041 (2013.01);
Abstract
Some demonstrative embodiments include apparatuses, systems and/or methods of determining one or more parameters of a refractive error of a tested eye. For example, a computing device may be configured to process depth mapping information to identify depth information of a tested eye; and to determine one or more parameters of a refractive error of the tested eye based on the depth information of the tested eye.