The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jul. 31, 2020
Futurewei Technologies, Inc., Plano, TX (US);
Richard Stirling-Gallacher, San Diego, CA (US);
Nathan Edward Tenny, Portland, OR (US);
Bin Liu, San Diego, CA (US);
Lili Zhang, Beijing, CN;
Futurewei Technologies, Inc., Plano, TX (US);
Abstract
A method includes measuring beam-formed reference signals transmitted by a plurality of mmWave transmission points (TPs), sending a cloud cell formation request including indicators associated with best mmWave TPs determined in accordance with the measured beam-formed reference signals, receiving a cloud cell formation request response including indicators associated with a subset of the best mmWave TPs selected by a central controller in accordance with selection information, where the subset of the best mmWave TPs includes a first mmWave transmission point (TP) serving as a master TP and a second mmWave TP serving as a slave TP, and establishing a cloud cell with mmWave TPs of the subset of the best mmWave TPs selected by the central controller, where a data connection is established with the slave TP and at least a control connection is established with the master TP.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile