The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Apr. 02, 2021
Applicant:

Fujitsu Frontech Limited, Tokyo, JP;

Inventors:

Kazuhisa Yoshimura, Inagi, JP;

Akio Maruyama, Inagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07D 7/12 (2016.01); G07D 7/005 (2016.01);
U.S. Cl.
CPC ...
G07D 7/12 (2013.01); G07D 7/005 (2017.05);
Abstract

In a banknote inspection device, a storage unit stores a first learning model generated using an image of a character with a hole as training data, and a second learning model generated using an image of a character without a hole as training data, and a recognition unit recognizes a serial number character that is a character forming a serial number of a banknote by using the first learning model when a character image, which is as image of the serial number character, has a hole, and recognize the serial number character by using the second learning model when the character image does not have a hole.


Find Patent Forward Citations

Yoshimura, Kazuhisa. (2022). Banknote inspection device, banknote inspection method, and banknote inspection program product (U.S. Patent No. 11423728). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11423728

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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