The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Apr. 04, 2017
Applicant:

Taleris Global Llp, Cheltenham, GB;

Inventors:

Robert William Horabin, Southampton, GB;

Mark John Robbins, Eastleigh, GB;

Thomas Antoine Raymond Bermudez, Southampton, GB;

Assignee:

TALERIS GLOBAL LLP, Cheltenham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); B64D 45/04 (2006.01); B64F 5/60 (2017.01); B64D 45/00 (2006.01); G07C 5/00 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); G07C 5/006 (2013.01); B64D 45/04 (2013.01);
Abstract

Systems and methods for formatting aviation data for improved aircraft fault detection, diagnosis, and maintenance are provided. One example method includes determining a plurality of available parameters associated with an aircraft. The method includes matching the plurality of available parameters against a plurality of desired parameters to identify a plurality of matched parameters that are both desired and available. The plurality of matched parameters are useful to perform fault diagnosis and prognosis for the aircraft. The method includes determining a priority level for each of the plurality of matched parameters. The method includes creating a standardized maintenance-optimized data frame configuration based at least in part on the plurality of matched parameters and the priority level for each of the plurality of matched parameters.


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