The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Sep. 26, 2018
Applicant:
Nec Corporation, Tokyo, JP;
Inventors:
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/145 (2022.01); G06T 7/73 (2017.01); G01B 5/28 (2006.01); G01B 11/30 (2006.01); H04N 5/235 (2006.01); G06V 20/80 (2022.01); G06T 1/00 (2006.01);
U.S. Cl.
CPC ...
G06V 10/145 (2022.01); G01B 5/28 (2013.01); G01B 11/30 (2013.01); G06T 7/73 (2017.01); G06V 20/80 (2022.01); H04N 5/2354 (2013.01); G06T 1/00 (2013.01);
Abstract
The present invention relates to an information processing device used in an image capture device that illuminates an object with an illuminating unit and images light reflected from the object as a reflection image with an imaging unit. The information processing device includes an irradiation angle determining unit configured to determine an irradiation angle when the illuminating unit illuminates the object based on a tilt statistic that is a value corresponding to tilt distribution of irregularities formed on the surface of the object.