The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jan. 19, 2017
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Yusuke Tamai, Kyoto, JP;
Shigeki Kajihara, Kyoto, JP;
Shin Fujita, Kyoto, JP;
Ryota Aisu, Kyoto, JP;
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); A61B 5/00 (2006.01); G06T 7/00 (2017.01); G06V 20/69 (2022.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); A61B 5/0033 (2013.01); G06T 7/0012 (2013.01); G06V 20/69 (2022.01);
Abstract
This analytical data analysis method uses machine learning of analysis result data () measured by an analyzer (), and includes generating simulated data () in which a data variation has been added to the analysis result data () within a range that does not affect identification, performing the machine learning using the generated simulated data (), and performing discrimination using a discrimination criterion () obtained through the machine learning.