The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Nov. 21, 2018
Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventor:

Yuhei Umeda, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06N 3/08 (2006.01); G06V 10/426 (2022.01); G06V 20/40 (2022.01); G06K 9/62 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06V 10/426 (2022.01); G06V 20/41 (2022.01); G06K 9/6267 (2013.01);
Abstract

A determination apparatus extracts a plurality of specific events that have values greater than an event determination threshold from among a plurality of events that have occurred in chronological order. The determination apparatus generates a feature amount related to adjacent occurrence intervals of the plurality of specific events, using the plurality of specific events. The determination apparatus generates array data corresponding to the plurality of events using points each having components of the event determination threshold and the feature amount, while changing the event determination threshold. The determination apparatus determines a type of the plurality of events using the array data.


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