The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Mar. 22, 2018
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Hagay Lupesko, San Mateo, CA (US);

Dominic Rajeev Divakaruni, Seattle, WA (US);

Jonathan Esterhazy, Alameda, CA (US);

Sandeep Krishnamurthy, Santa Clara, CA (US);

Vikram Madan, San Francisco, CA (US);

Roshani Nagmote, San Mateo, CA (US);

Naveen Mysore Nagendra Swamy, Campbell, CA (US);

Yao Wang, Sunnyvale, CA (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06N 3/10 (2006.01);
U.S. Cl.
CPC ...
G06N 3/04 (2013.01); G06N 3/08 (2013.01); G06N 3/10 (2013.01);
Abstract

Techniques for model adaptation are described. For example, a method of receiving a call to provide either a model variant or a model variant profile of a deep learning model, the call including desired performance of the deep learning model, a deep learning model identifier, and current edge device characteristics; comparing the received current edge device characteristics to available model variants and profiles based on the desired performance of the deep learning model to generate or select a model variant or profile, the available model variants and profiles determined by the model identifier; and sending the generated or selected model variant or profile to the edge device to use in inference is detailed.


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