The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Jul. 26, 2019
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Biplob Debnath, Princeton, NJ (US);

Debayan Deb, Okemos, MI (US);

Srimat Chakradhar, Manalapan, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2022.01); G06N 20/10 (2019.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6269 (2013.01); G06K 9/6219 (2013.01); G06K 9/6256 (2013.01); G06N 20/10 (2019.01); G06T 7/0002 (2013.01);
Abstract

A method is provided for classifying objects. The method detects objects in one or more images. The method tags each object with multiple features. Each feature describes a specific object attribute and has a range of values to assist with a determination of an overall quality of the one or more images. The method specifies a set of training examples by classifying the overall quality of at least some of the objects as being of an acceptable quality or an unacceptable quality, based on a user's domain knowledge about an application program that takes the objects as inputs. The method constructs a plurality of first-level classifiers using the set of training examples. The method constructs a second-level classifier from outputs of the first-level automatic classifiers. The second-level classifier is for providing a classification for at least some of the objects of either the acceptable quality or the unacceptable quality.


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