The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Nov. 28, 2018
Applicant:

Toyota Research Institute, Inc., Los Altos, CA (US);

Inventor:

Patrick K. Herring, Mountain View, CA (US);

Assignee:

Toyota Research Institute, Inc., Los Altos, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06T 7/10 (2017.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06N 20/00 (2019.01); G06T 7/10 (2017.01); G06T 2207/20081 (2013.01);
Abstract

System, methods, and other embodiments described herein relate to predicting effects of a stimulus on a particle or other material structure. In one embodiment, a method includes receiving a segmented image of a particle that identifies at least semantics of the particle and associated characteristics according to subregions of the particle. The method includes analyzing, using a stimulus model, the segmented image to predict changes in the particle associated with applying the stimulus to the particle. Analyzing the segmented image includes generating a predicted image identifying characteristics, semantics and other properties of the particle according to the changes. The method includes providing the predicted image as an electronic output.


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