The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Sep. 28, 2018
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Jan Stijohann, Munich, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 21/60 (2013.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3692 (2013.01); G06F 11/3476 (2013.01); G06F 11/3664 (2013.01); G06F 11/3688 (2013.01); G06F 21/602 (2013.01);
Abstract

Provided is a method for recognizing a weak point in an original program using a test program, the original program being configured to perform a predetermined function on input data when executed in a predetermined runtime environment and the test program being configured to execute the same predetermined function on the input data when executed in the predetermined runtime environment, including: Weak points of a program can be determined dynamically, without having to perform a time consuming testing in an artificial test environment.


Find Patent Forward Citations

Stijohann, Jan. (2022). Method, device and test program for recognizing a weak point in an original program (U.S. Patent No. 11422928). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11422928

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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