The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jun. 13, 2019
International Business Machines Corporation, Armonk, NY (US);
Andrew Hicks, Wappingers Falls, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for identifying optimal tests includes defining functional coverage by a test suite based on a functional coverage model of a System Under Test (SUT). The test suite includes a plurality of tests. The functional coverage model includes a plurality of attributes, each attribute having a set of possible values. The functional coverage model defines possible combinations of values of the attributes as covered by the test suite. A subset of the possible combinations of values is determined. A subset of the plurality of tests is selected that is operative to cover the determined subset of the possible combinations of values. A plurality of trees is generated to represent the selected subset of tests. Complexity of the generated trees is analyzed based on user-specified criteria. An optimal tree is selected from the subset of the plurality of trees to achieve the objective of the test suite.