The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Nov. 29, 2018
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Hiroshi Imai, Ikoma, JP;

Tetsuji Yamato, Yokohama, JP;

Taiji Yoshikawa, Kizugawa, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/34 (2006.01); G06F 16/908 (2019.01); G16Y 40/10 (2020.01); G16Y 40/35 (2020.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3452 (2013.01); G06F 11/3058 (2013.01); G06F 11/3089 (2013.01); G06F 16/908 (2019.01); G16Y 40/10 (2020.01); G16Y 40/35 (2020.01);
Abstract

A metadata generation apparatus capable of generating metadata, as well as a metadata generation method and program are provided. The sensing device is configured to generate an output value based on a physical amount that is input. The metadata generation apparatus includes a probability density function generation unit and a metadata generation unit. The probability density function generation unit is configured to generate a probability density function of an output value when a specific physical amount is input to the sensing device. The metadata generation unit is configured to generate metadata based on the probability density function.


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