The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Jan. 10, 2020
Applicant:

Dakewe (Shenzhen) Medical Equipment Co., Ltd, Guangdong, CN;

Inventors:

Yuhao Tang, Shenzhen, CN;

Qiyue Yu, Shenzhen, CN;

Junfeng He, Shenzhen, CN;

Qingjun Wu, Shenzhen, CN;

Jianfei Wei, Shenzhen, CN;

Jian Deng, Shenzhen, CN;

Yahong Liu, Shenzhen, CN;

Xiongbing Zhou, Shenzhen, CN;

Yang Wang, Shenzhen, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/02 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G02B 21/362 (2013.01); G02B 21/02 (2013.01); H04N 5/2258 (2013.01);
Abstract

The disclosure relates to the field of digital pathology imaging technologies, in particular, to a digital pathology scanner for large-area microscopic imaging. The digital pathology scanner for large-area microscopic imaging includes a plurality of microscopic objectives and a plurality of digital image sensors; the microscopic objectives and the digital image sensors are equal in quantity and are fixed relatively in a one-to-one correspondence manner. The digital image sensors are sequentially distributed so as to form a sensor array. The sensor array enables images formed by the digital image sensors to be sequentially distributed without intervals in a second direction when moving in a first direction, wherein the first direction is perpendicular to the second direction.


Find Patent Forward Citations

Quick Actions:

Tang, Yuhao. (2022). Digital pathology scanner for large-area microscopic imaging (U.S. Patent No. 11422354). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11422354

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…