The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
May. 11, 2021
Nxp B.v., Eindhoven, NL;
Shikhar Makkar, Palwal, IN;
NXP B.V., Eindhoven, NL;
Abstract
A scan flip-flop includes a selection circuit, a primary latch, a secondary latch, and a data retention latch. The selection circuit selects and outputs one of functional data, first reference data, scan data, and first control data as second reference data. The primary latch receives the second reference data and outputs third reference data, whereas the secondary latch receives the third reference data and outputs second control data. The second control data is then provided to a subsequent scan flip-flop of a scan chain. The data retention latch receives one of the third reference data and the second control data, and outputs and provides the first reference data to the selection circuit. The first reference data corresponds to functional data retained in the scan flip-flop during a structural testing mode associated with the scan chain.