The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jan. 26, 2021
National University Corporation Kobe University, Hyogo, JP;
Integral Geometry Science Inc., Hyogo, JP;
Kenjiro Kimura, Hyogo, JP;
Noriaki Kimura, Hyogo, JP;
National University Corporation Kobe University, Hyogo, JP;
Integral Geometry Science Inc., Hyogo, JP;
Abstract
Provided is a measurement device including an application unit, a detection unit, and a calculation unit. The application unit applies a first magnetic field, which is generated by applying a pulse current to a coil or applying currents with a plurality of frequencies to the coil in order, to an object. The detection unit detects a second magnetic field which is generated by applying the first magnetic field to the object. The calculation unit calculates a distribution of a magnetic field source m in the second magnetic field. The calculation unit may further generate an imaging signal for displaying the calculated distribution of the magnetic field source m, as an image. The display unit displays the image indicating the distribution of the magnetic field source m by using the imaging signal.