The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Jan. 11, 2019
Applicants:

Universiteit Hasselt, Hasselt, BE;

Ludwig-maximilians-universität München, Munich, DE;

Inventors:

Jelle Hendrix, Holsbeek, BE;

Nick Smisdom, Geel, BE;

Don Lamb, Munich, DE;

Waldemar Schrimpf, Munich, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/6428 (2013.01); G01N 2021/6441 (2013.01); G01N 2021/6471 (2013.01);
Abstract

The analysis of data from fluorescence microscopy is disclosed, more especially fluorescence fluctuation microscopy, being a correlation analysis of fluctuation of the fluorescence intensity enabling quantitative and dynamic information capture. In particular the analysis is described of characteristics such as concentrations, mobility, interactions, stoichiometry, etc. of mixtures of particular that are fluorescently labeled with differently colored fluorophores having different excitation/emission spectra using fluctuation microscopy.


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