The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Dec. 06, 2018
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Axel Scherer, Barnard, VT (US);

Amirhossein Nateghi, Pasadena, CA (US);

Taeyoon Jeon, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/03 (2006.01); G01N 1/42 (2006.01); G01N 1/44 (2006.01); G01N 21/17 (2006.01); G01N 21/25 (2006.01); G01N 21/35 (2014.01); G01N 21/3504 (2014.01); G01N 21/3577 (2014.01);
U.S. Cl.
CPC ...
G01N 21/0303 (2013.01); G01N 1/42 (2013.01); G01N 1/44 (2013.01); G01N 21/171 (2013.01); G01N 21/255 (2013.01); G01N 21/35 (2013.01); G01N 21/3504 (2013.01); G01N 21/3577 (2013.01);
Abstract

The present disclosure is directed toward a measurement system capable of rapid spectroscopic and calorimetric analysis of the chemical makeup of a test sample. Systems in accordance with the present disclosure include a low-thermal-mass sample holder having a substrate whose surface has been engineered to create a large-area sample-collection surface. The sample holder includes an integrated temperature controller that can rapidly heat or cool the test sample. As a result, the sample holder enables differential scanning calorimetry Fourier-Transform Infrared Spectroscopy (DSC-FTIR) that can be performed in minutes rather than hours, as required in the prior art.


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