The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Oct. 30, 2017
Applicant:

Tsi Incorporated, Shoreview, MN (US);

Inventors:

Robert Caldow, Roseville, MN (US);

Sean Morell, Saint Paul, MN (US);

Kenneth Farmer, Lake Elmo, MN (US);

Sreenath Avula, Arden Hills, MN (US);

Assignee:

TSI Incorporated, Shoreview, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 47/00 (2006.01); G01N 15/06 (2006.01); B01D 5/00 (2006.01); G01N 15/00 (2006.01); G01N 15/02 (2006.01); B05C 3/00 (2006.01); B05C 3/02 (2006.01);
U.S. Cl.
CPC ...
G01N 15/065 (2013.01); B01D 5/00 (2013.01); B01D 5/0027 (2013.01); B05C 3/005 (2013.01); B05C 3/02 (2013.01); G01N 15/02 (2013.01); G01N 2015/0038 (2013.01); G01N 2015/0046 (2013.01);
Abstract

Various embodiments include composite wicks for ultra-low noise condensation particle counters (CPCs). In one embodiment, a composite wick includes a first porous material having a first pore density, with the first porous material further having a first surface and an opposing second surface. A second porous material is in fluid communication with the first porous material and has a first surface with an area substantially the same as an area of the first surface of the first porous material. The first surface of the second porous material is substantially in contact with the first surface of the first porous material. The second porous material has a pore density that is dissimilar the first pore density of the first material. The first material and the second material are configured to provide vapor from a liquid to a fluid-based particle counter. Other apparatuses are disclosed.


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