The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Jul. 29, 2019
Applicant:

GM Global Technology Operations Llc, Detroit, MI (US);

Inventor:

Kenneth L. Oblizajek, Troy, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 17/04 (2006.01); B60G 17/08 (2006.01); F16F 9/53 (2006.01); B60G 13/08 (2006.01);
U.S. Cl.
CPC ...
G01M 17/04 (2013.01); B60G 13/08 (2013.01); B60G 17/08 (2013.01); F16F 9/532 (2013.01); F16F 9/535 (2013.01); B60G 2202/24 (2013.01); B60G 2500/10 (2013.01); B60G 2600/182 (2013.01); B60G 2800/162 (2013.01); F16F 2222/06 (2013.01); F16F 2228/066 (2013.01); F16F 2230/0017 (2013.01);
Abstract

A method for quantifying dynamic response characteristics of a real-time damper includes positioning the damper between a stationary member and a moveable member of a shock press having a force transducer, and transmitting motion control signals to the shock press, via a test controller, to stroke the moveable member and cause the damper to move with a constant velocity between extremes of stroke. A test drive signal is transmitted to the damper for a calibrated test duration. The test drive signal has a calibrated discrete frequency, frequencies, or a frequency sweep range. The method includes measuring, via the force transducer, a force component of the damper while transmitting the test drive signal, and quantifying the response characteristics of the damper over the test duration, including recording the response characteristics in a memory device. A test system includes a shock press, force transducer, and test controller.


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