The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

May. 29, 2020
Applicant:

Hitachi High-tech Science Corporation, Tokyo, JP;

Inventors:

Susumu Ito, Tokyo, JP;

Eita Shimoda, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 11/12 (2021.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
G01K 11/12 (2013.01); G01N 25/00 (2013.01);
Abstract

The thermal analysis apparatus configured to measure thermal behavior accompanying a temperature change of a sample in a heating furnace, includes: the heating furnace having an opening, through which the sample is observable; a thermal behavior measurement unit for measuring the thermal behavior; an imaging unit for capturing image data of the sample in the heating furnace through the opening; a storage unit for storing the thermal behavior and the image data with respect to a temperature; a control unit; and an image processing unit for generating predetermined color information based on the image data, the control unit being configured to instruct the image processing unit to generate the predetermined color information with respect to a plurality of temperatures, and cause a predetermined display unit to display a plurality of pieces of the predetermined color information and the thermal behavior in superimposition with respect to the plurality of temperatures.


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