The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Nov. 23, 2020
Intelon Optics, Inc., Lexington, MA (US);
Peng Shao, Edmonton, CA;
Paul Robert Parise, Clinton, CT (US);
Kwangsup Shin, Chestnut Hill, MA (US);
Maxwell Kotlarchyk, Arlington, MA (US);
Intelon Optics, Inc., Lexington, MA (US);
Abstract
Input light comprising an optical signal associated with a spectrum of at least a portion of the input light is received into an interferometer. Data comprising an image is provided using a detector array comprising detection elements. Output light is received from the interferometer into a set of one or more optical elements, which provide an optical interference pattern associated with an intensity of at least a portion of the output light that is distributed over a set of detection elements. Detection of the optical signal is stabilized based at least in part on the data using a control system comprising: a light-control module that controls a first feedback loop that stabilizes the portion of the output light; and/or a temperature-control module that controls a second feedback loop that stabilizes a temperature sensed by at least one temperature sensor within a thermal environment associated with the interferometer.