The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Jun. 09, 2020
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Fumio Ohtomo, Saitama, JP;

Tetsuji Anai, Tokyo-to, JP;

Kaoru Kumagai, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/26 (2006.01); G01C 15/00 (2006.01); G01C 15/02 (2006.01);
U.S. Cl.
CPC ...
G01C 15/006 (2013.01); G01C 15/02 (2013.01);
Abstract

A surveying instrument include a surveying instrument including a surveying instrument main body, a measuring direction image pickup module for acquiring a first image, a distance measuring unit for measuring a distance to the object, a projecting direction detecting module for detecting a projecting direction of the distance measuring light, a time detector for generating a signal of a reference time, a downward image pickup module for acquiring a second image, an attitude detector for detecting a tilt of the surveying instrument main body and an arithmetic control module, wherein the arithmetic control module is configured to detect a change between the first images or the second images, determine a measuring point of the object with respect to the vertical lower image based on the change between the images and the detection results of the distance measuring unit and the projecting direction detecting module and the reference time.


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