The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jan. 25, 2019
Visotec Gmbh, Lübeck, DE;
Michael Münst, Lübeck, DE;
Helge Sudkamp, Lübeck, DE;
Peter Koch, Lübeck, DE;
Gereon Hüttmann, Lübeck, DE;
VISOTEC GMBH, Lübeck, DE;
Abstract
The invention relates to a method for creating a two-dimensional interferogram with a Michelson-type free-beam interferometer, comprising an extended, partially spatially coherent light source and a two-dimensional light detector, wherein light from the light source is split by a beam splitter with a semitransparent beam splitter mirror into a sample light beam and a reference light beam and taken to a sample arm and a reference arm, wherein the sample light beam returning from a sample is directed by the beam splitter mirror onto the light detector, wherein the reference light beam emerging from the reference arm makes a predetermined angle greater than zero with the sample light beam on the light detector, and wherein the length of the reference arm is variable, where the reference light beam is directed by means of an odd number of reflections in each reflection plane in at least one reference arm section so that it is displaced laterally to itself and travels antiparallel through a light-deflecting element working by refraction or diffraction which is secured at the exit of the reference arm.