The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Apr. 26, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Tyler A. Marshall, Sunnyvale, CA (US);

Christopher D. Jones, Los Altos, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C03C 10/00 (2006.01); G02F 1/055 (2006.01);
U.S. Cl.
CPC ...
C03C 10/0009 (2013.01); G02F 1/0556 (2013.01);
Abstract

Electronic device components that include a glass portion and a ceramic or a glass ceramic portion are disclosed. The ceramic or glass ceramic portions of the component may be located to provide desired performance characteristics to the component, which may be an enclosure component. In addition, regions of compressive stress may be formed within the glass portion, the glass ceramic portion, or both to further adjust the performance characteristics of the component. Electronic devices including the components and methods for making the components are also provided.


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Marshall, Tyler. (2022). Localized control of bulk material properties (U.S. Patent No. 11420900). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11420900

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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