The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Apr. 30, 2018
Hewlett-packard Development Company, L.p., Spring, TX (US);
Sunil Kothari, Palo Alto, CA (US);
Juan Carlos Catana, Guadalajara, MX;
Tod Heiles, Vancouver, WA (US);
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
In some examples, with respect to region of interest monitoring and control for additive manufacturing, a blob detection analysis may be performed on first and second component images associated with additive manufacturing of a component, and blobs that remain a same shape and include same centroids on the first and second component images may be identified. A further blob detection analysis may be performed on first and second thermal images associated with the first and second component images, and a determination may be made as to whether one of the identified blobs includes a same shape and a different centroid between the first and second thermal images. Based on a determination that the one of the identified blobs includes the same shape and the different centroid, an indication of a thermal camera misalignment associated with the additive manufacturing may be generated.