The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 23, 2022

Filed:

Sep. 18, 2018
Applicant:

Dowa Electronics Materials Co., Ltd., Tokyo, JP;

Inventors:

Yoshiyuki Michiaki, Tokyo, JP;

Masahiro Yoshida, Tokyo, JP;

Kenichi Inoue, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B22F 1/10 (2022.01); B22F 9/08 (2006.01); B22F 1/05 (2022.01); C22C 5/08 (2006.01); C23C 2/28 (2006.01);
U.S. Cl.
CPC ...
B22F 9/08 (2013.01); B22F 1/05 (2022.01); C22C 5/08 (2013.01); B22F 2009/0804 (2013.01); B22F 2301/10 (2013.01); B22F 2301/255 (2013.01); B22F 2304/10 (2013.01); C23C 2/28 (2013.01);
Abstract

A silver powder which has a small content of carbon and which is difficult to be agglutinated, and a method for producing the same. While a molten metal, which is prepared by melting silver to which 40 ppm or more of copper is added, is allowed to drop, a high-pressure water is sprayed onto the molten metal to rapidly cool and solidify the molten metal to produce a silver powder which contains 40 ppm or more of copper, 0.1% by weight or less of carbon and 0.1% by weight or less of oxygen and wherein the particle diameter (D50 diameter) corresponding to 50% of accumulation in volume-based cumulative distribution of the silver powder, which is measured by means of a laser diffraction particle size analyzer, is in the range of from 1 μm to 15 μm, the average particle diameter (SEM diameter) of single particles being in the range of from 1 μm to 8 μm when it is measured by means of a field emission scanning electron microscope (SEM), the ratio (SEM diameter/D50 diameter) of the SEM diameter to the D50 diameter being in the range of from 0.3 to 1.0.


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