The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2022
Filed:
Jan. 12, 2017
Applicant:
Duke University, Durham, NC (US);
Inventors:
Benjamin B. Yellen, Durham, NC (US);
Roozbeh Abedini-Nassab, Durham, NC (US);
Korine A. Ohiri, Durham, NC (US);
David M. Murdoch, Durham, NC (US);
Kris Wood, Durham, NC (US);
Assignee:
Duke University, Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 33/543 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502761 (2013.01); G01N 33/54326 (2013.01); B01L 2200/0668 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0864 (2013.01); B01L 2300/0893 (2013.01); B01L 2400/043 (2013.01); B01L 2400/0436 (2013.01); B01L 2400/0487 (2013.01);
Abstract
Provided herein are devices, systems, and methods for analysis of objects, such as cells. The devices, systems, and methods organize a plurality of objects in a plurality of partitions by trapping an object in a trap and transferring the object to an adjacent partition. The devices, systems, and methods provide for parallel analysis of a plurality of objects.