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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11419555 B1

PDFFull Text
Date of Patent:
Aug. 23, 2022

Filed:

Feb. 05, 2015

Image capturing apparatus and method

Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yoshimi Noguchi, Tokyo, JP;

Masahiro Ogino, Tokyo, JP;

Assignee:

FUJIFILM Healthcare Corporation, Kashiwa, JP;

Attorney:

Crowell & Moring LLP

Primary Examiner:

Joseph M Santos Rodriguez

Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/055 (2006.01); G01R 33/56 (2006.01); A61B 6/02 (2006.01); G01R 33/561 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 8/14 (2006.01); G06T 5/00 (2006.01); G06T 11/00 (2006.01); A61B 8/00 (2006.01); G01R 33/48 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7203 (2013.01); A61B 5/055 (2013.01); A61B 5/7253 (2013.01); A61B 6/027 (2013.01); A61B 6/032 (2013.01); A61B 6/5205 (2013.01); A61B 8/14 (2013.01); G01R 33/56 (2013.01); G01R 33/561 (2013.01); G01R 33/5608 (2013.01); G06T 5/002 (2013.01); G06T 11/003 (2013.01); A61B 8/00 (2013.01); A61B 2576/00 (2013.01); G01R 33/482 (2013.01); G01R 33/4824 (2013.01); G06T 2207/10088 (2013.01);
Abstract

To acquire a higher-quality image with high-speed imaging in an MRI apparatus or the like to which compressed sensing is applied. Included are: an observation unit that does not observe, when any one of two points being point-symmetric with respect to the origin is observed, the other point in observation of a high frequency component of a K-space of the MRI apparatus; and a reconstruction unit that reconstructs an image from a component of the K-space observed by the observation unit. The reconstruction process of the reconstruction unit includes an image correction process based on an observation pattern of the observation unit.

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