The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 16, 2022

Filed:

Apr. 23, 2020
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventors:

Sam Heidari, Los Altos Hills, CA (US);

Kamlesh Rath, Pleasanton, CA (US);

Raghuram Rangarajan, Fremont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/02 (2009.01); H04W 24/08 (2009.01); H04W 84/12 (2009.01); H04L 41/0816 (2022.01); H04L 43/0817 (2022.01); H04L 43/0852 (2022.01); H04L 43/087 (2022.01); H04L 41/5019 (2022.01);
U.S. Cl.
CPC ...
H04W 24/02 (2013.01); H04L 41/0816 (2013.01); H04L 41/5019 (2013.01); H04W 24/08 (2013.01); H04L 43/087 (2013.01); H04L 43/0817 (2013.01); H04L 43/0852 (2013.01); H04W 84/12 (2013.01);
Abstract

A method may include obtaining multiple first parameters associated with a wireless network. The first parameters include one or more environment-specific parameters and one or more packet-specific parameters. The method may include generating a metric from a combination of the first parameters. The method may include, in response to determining to adjust the performance of the wireless network based on the metric, determining one or more operating parameters to adjust. The method may include adjusting the performance of the wireless network by adjusting the one or more operating parameters.


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